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Chemometrics from basick to wavelet transform - Chau F.T

Chau F.T Chemometrics from basick to wavelet transform - Wiley publishing , 2004. - 333 p.
ISBN 0-471-20242-8
Download (direct link): chemometricsfrombasics2004.pdf
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63. X. G. Shao, C. Y Pang, and Q. D. Su, ‘‘A novel method to calculate the approximate derivative photoacoustic spectrum using continuous wavelet transform,'' Fresenius J. Anal. Chem. 367(6):525-529 (2000).
64. Y Ding, T Nanba, and Y Miura, ‘‘Wavelet analysis of X-ray diffraction pattern for glass structures,'' Phys. Rev. B58:14279-14287 (1998).
65. X. G. Shao, L. M. Shao, and G. W. Zhao, ‘‘Extraction of extended X-ray absorption fine structure information from the experimental data using the wavelet transform,'' Anal. Commun. 35:135-144 (1998).
66. T. Artursson, A. Hagman, S. Bjork, J. Trygg, S. Wold, and S. P Jacobsson, ‘‘Study of preprocessing methods for the determination of crystalline phases in binary mixtures of drug substances by X-ray powder diffraction and multivariate calibration,'' Appl. Spectrosc. 54:1222-1230 (2000).
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application of wavelet transform in chemistry
67. D. A. Sadler, D. Littlejohn, P. R. Boulo, and J. S. Soraghan, ‘‘Application of wavelet transforms to determine peak-shape parameters for interference detection in graphite-furnace atomic-absorption spectrometry,'' Spectrochim. Acta, Part B, 53B:1015-1030 (1998).
68. X. G. Ma and Z. X. Zhang, ‘‘Correction for background of ICP-AES signal by means of wavelet transform,'' Spectrosc. Spect. Anal. 20:507-509 (2000).
69. L. Eriksson, J. Trygg, E. Johansson, R. Bro, and S. Wold, ‘‘Orthogonal signal correction, wavelet analysis, and multivariate calibration of complicated process fluorescence data,'' Anal. Chim. Acta 420:181-195 (2000).
70. L. Yan and J. Y. Mo, ‘‘Study on new real-time digital wavelet filters to electroanalytical signals,'' Chin. Sci. Bull. 42(17):1567-1570 (1995).
71. H. Fang and H. Y. Chen, ‘‘Wavelet analyses of electroanalytical chemistry responses and an adaptive wavelet filter,'' Anal. Chim. Acta 346:319-325 (1997).
72. H. Fang, J. J. Xu, and H. Y. Chen, ‘‘A new method of extracting weak signal,'' Acta Chim. Sin. 56:990-993 (1998).
73. H. B. Zhong, J. B. Zheng, Z. X. Pan, M. S. Zhang, and H. Gao, ‘‘Investigation on application of wavelet transform in recovering useful information from oscillographic signal,'' Chem. J. Chin. Univ. 19:547-549 (1998).
74. J. B. Zheng, H. B. Zhong, H. Q. Zhang, D. Y. Yang, Z. X. Pan, M. S. Zhang, and H. Gao, ‘‘Application of wavelet transform in retrieval of useful information from d2E/dt2 - t Signal,'' Chin. J. Anal. Chem. 26:25-28. (1998).
75. X. P. Zheng, J. Y. Mo, and P. X. Cai, ‘‘Simultaneous application of spline wavelet and Riemann-Liouville transform filtration in electroanalytical chemistry,'' Anal. Commun. 35:57-59 (1998).
76. X. P. Zheng and J. Y. Mo, ‘‘The coupled application of the B-spline wavelet and RLT filtration in staircase voltammetry,'' Chemometr. Intell. Lab. Syst. 45:157-161 (1999).
77. A. Aballe, M. Bethencourt, F. J. Botana, and M. Marcos, ‘‘Using wavelet transform in the analysis of electrochemical noise data,'' Electrochim. Acta 44:4805-4816 (1999).
78. J. Chen, H. B. Zhong, Z. X. Pan, and M. S. Zhang, ‘‘Application of the wavelet transform in differential pulse voltammetric data processing,'' Chin. J. Anal. Chem 24:1002-1006 (1996).
79. H. Wang, Z. X. Pan, W. Liu, M. S. Zhang, S. Z. Si, and L. P. Wang, ‘‘The determination of potentiometric titration end-points by using wavelet transform,'' Chem. J. Chin. Univ. 18:1286-1290 (1997).
80. X. Q. Zhang, J. B. Zheng, and H. Gao, ‘‘Wavelet transform-based Fourier deconvolution for resolving oscillographic signals,'' Talanta 55:171-178 (2001).
81. S. G. Wu, L. Nie, J. W. Wang, X. Q. Lin, L. Z. Zheng, and L. Rui, ‘‘Flip shift subtraction method: A new tool for separating the overlapping voltammetric peaks on the basis of finding the peak positions through the continuous wavelet transform,'' J. Electroanal. Chem. 508:11-27 (2001).
82. X. G. Shao, C. Y. Pang, S. G. Wu, and X. Q. Lin, ‘‘Development of wavelet transform voltammetric analyzer,'' Talanta 50:1175-1182 (1999).
references
255
83. S. L. Shew, Method and Apparatus for Determining Relative Ion Abundances in Mass Spectrometry Utilizing Wavelet Transforms, U.S. Patent 5,436,447, (July 25, 1995).
84. H. Hutter, C. Brunner, S. Nikolov, C. Mittermayer, and M. Grasserbauer, ‘‘Imaging surface spectroscopy for two- and three-dimensional characterization of materials,'' Fresenius J. Anal. Chem. 355:585-590 (1996).
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88. M. G. Wolkenstein, and H. Hutter, “Compression of secondary ion microscopy image sets using a three-dimensional wavelet transformation,” Microsc. Microanal. 6(1):68-75 (2000).
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